From IEEE 1450-1999:
Vector: Every signal’s stimuli/response to be applied/observed in the smallest integral “step” of a device test. Contains a collection of waveforms to be applied to the primary signals. See: T0.
- Note: 1450-1999 associates a vector to a tester cycle
- T0 (pronounced “tee-zero”): A reference to a MASTER clock that synchronizes all events across all signals to a common starting point. Initiates the start of each test vector.
Ian: May not have been a need for this in 1149.1 or 1687 since they talk about tests that are not necessarily “at speed” types of test, but instruments bring a new role to these tests instead of limited to TCK speed
structural vectors: A pattern generated to exercise a device’s structural elements (e.g., scan-based ATPG test generation). Contrast with: functional vectors.