Definition of BIST (Built-in Self Test)

[Ian McIntosh]

We struggled a bit during today's meeting (April 14) to scope what BIST is or is not, so we took a stab at defining device-level BIST as a starting point:

At the device level, BIST is concerned with confirming the logical function and internal structural integrity of the device. BIST may be executed at device power-up or as demanded by some external event.

Anyone care to suggest revisions to the above?

[Ian McIntosh]

Resurrecting a very old topic, this came up during the last meeting of 2017 and Louis suggested that BIST (to differentiate from BIT) was a test that did not require any resources other than those provided by the tested item itself.
I think I've captured Louis' suggestion there and infer that this applies, or could apply, to any level: device, board, module...