Definition of BIST (Built-in Self Test)

Common section for discussion of glossary terms. Please create a new topic for each term.
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Ian McIntosh
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Location: Leonardo, UK

Definition of BIST (Built-in Self Test)

Post by Ian McIntosh »

We struggled a bit during today's meeting (April 14) to scope what BIST is or is not, so we took a stab at defining device-level BIST as a starting point:
At the device level, BIST is concerned with confirming the logical function and internal structural integrity of the device. BIST may be executed at device power-up or as demanded by some external event.
Anyone care to suggest revisions to the above?
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Ian McIntosh
SJTAG Chair
Posts: 484
Joined: Mon Nov 05, 2007 11:49 pm
Location: Leonardo, UK

Re: Definition of BIST (Built-in Self Test)

Post by Ian McIntosh »

Resurrecting a very old topic, this came up during the last meeting of 2017 and Louis suggested that BIST (to differentiate from BIT) was a test that did not require any resources other than those provided by the tested item itself.
I think I've captured Louis' suggestion there and infer that this applies, or could apply, to any level: device, board, module...
Ian McIntosh
Testability Lead
Leonardo UK