Definition of BIST (Built-in Self Test)

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Ian McIntosh
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Definition of BIST (Built-in Self Test)

Post by Ian McIntosh » Mon Apr 14, 2008 7:32 pm

We struggled a bit during today's meeting (April 14) to scope what BIST is or is not, so we took a stab at defining device-level BIST as a starting point:
At the device level, BIST is concerned with confirming the logical function and internal structural integrity of the device. BIST may be executed at device power-up or as demanded by some external event.
Anyone care to suggest revisions to the above?

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Ian McIntosh
SJTAG Chair
Posts: 395
Joined: Mon Nov 05, 2007 11:49 pm
Location: Leonardo MW Ltd, UK
Contact:

Re: Definition of BIST (Built-in Self Test)

Post by Ian McIntosh » Sun Dec 24, 2017 1:28 pm

Resurrecting a very old topic, this came up during the last meeting of 2017 and Louis suggested that BIST (to differentiate from BIT) was a test that did not require any resources other than those provided by the tested item itself.
I think I've captured Louis' suggestion there and infer that this applies, or could apply, to any level: device, board, module...
Ian McIntosh
Testability Lead
Leonardo MW Ltd.

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